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This report documents the preparation and certification of a silicon powder reference material used to evaluate powder-diffraction instruments. SRM 640g provides a standard for line position and line shape in measurements made with laboratory and synchrotron X-rays and with neutron diffractometers.
The complete February 2024 study describes the material, experimental procedures, analysis of the diffraction data and evaluation of uncertainty. Original figures, measurements and supporting calculations show how the certified values were established for this generation of the reference material.
James P. Cline, Marcus H. Mendenhall, David Black, Albert Henins and Jack B. Prothero. NIST, 2024. https://doi.org/10.6028/NIST.SP.260-245. Republished courtesy of the National Institute of Standards and Technology.